APT Flanders

3D Materials Characterization at the Atomic-Level

Atom Probe Tomography (APT) identifies individual atoms and their spatial location in 3 dimensions. Due to its high sensitivity (< ppm) and sub-nanometer spatial resolution, APT enables you to characterize material properties at the atomic level with high precision and sensitivity. Obtaining a quantitative 3D elemental distribution map provides access to materials properties such as compositional distribution on the atomic scale, segregation at grain boundaries, defects and interfaces, precipitate and cluster formation in compounds and alloys, interfacial reactions and diffusion in thin films, dopant and impurity distribution in 3D nanostructures, and many more. It can be applied to various types of materials including, but not limited to, metals, semiconductors, insulators, ceramics, oxides...

The Flemish Atom Probe user facility is an initiative of the KU Leuven, University Hasselt, University Ghent and OCAS, sponsored by the Hercules foundation, and aims to stimulate nanoscale materials research within the Flemish research landscape by facilitating access to this new technology. Beyond serving the needs of the consortium, access to Atom Probe Tomography and related know-how will be provided to all parties from Flemish research institutes and industry interested in characterizing materials at the atomic level.

You want to learn more about how Atom Probe Tomography can advance your research or how to use the Flemish APT facility? Than please visit the APT expertise center for more information or contact us directly.

Si Nanowire with high-κ gate all-around and B implants

The distribution and iso-surface of Ti and Mo in the laboratory steel grade